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Results:
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Results: 1
The characterization of silicon nitride films by contactless transient photoconductivity measurements
Authors:
Kunst, M Abdallah, O Wunsch, F
Citation:
M. Kunst et al., The characterization of silicon nitride films by contactless transient photoconductivity measurements, THIN SOL FI, 383(1-2), 2001, pp. 61-64
Risultati:
1-1
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