Authors:
Misiuk, A
Bak-Misiuk, J
Antonova, IV
Raineri, V
Romano-Rodriguez, A
Bachrouri, A
Surma, HB
Ratajczak, J
Katcki, J
Adamczewska, J
Neustroev, EP
Citation: A. Misiuk et al., Effect of uniform stress on silicon implanted with helium, hydrogen and oxygen, COMP MAT SC, 21(4), 2001, pp. 515-525
Authors:
Bak-Misiuk, J
Dynowska, E
Misiuk, A
Calamiotou, M
Kozanecki, A
Domagala, J
Kuristyn, D
Glukhanyuk, W
Georgakilas, A
Trela, J
Adamczewska, J
Citation: J. Bak-misiuk et al., Effect of high temperature-pressure on GaAs layers grown on vicinal Si substrates, CRYST RES T, 36(8-10), 2001, pp. 997-1003
Authors:
Papis, E
Piotrowska, A
Kaminska, E
Golaszewska, K
Jung, W
Katcki, J
Kudla, A
Piskorski, M
Piotrowski, TT
Adamczewska, J
Citation: E. Papis et al., Sulfide treatment of GaSb surface: influence on the LPE growth of InGaAsSb/AlGaAsSb heterostructures, VACUUM, 57(2), 2000, pp. 171-178
Authors:
Bak-Misiuk, J
Adamczewska, J
Domagala, J
Zytkiewicz, ZR
Trela, J
Misiuk, A
Leszczynski, M
Jun, J
Surma, HB
Wnuk, A
Citation: J. Bak-misiuk et al., Influence of high hydrostatic pressure-high temperature treatment on defect structure of AlGaAs layers, J ALLOY COM, 286(1-2), 1999, pp. 279-283