Authors:
Gilmer, D
Hobbs, C
Hegde, R
La, L
Adetutu, O
Conner, J
Tiner, M
Prabhu, L
Bagchi, S
Tobin, P
Citation: D. Gilmer et al., Investigation of titanium nitride gates for tantalum pentoxide and titanium dioxide dielectrics, J VAC SCI A, 18(4), 2000, pp. 1158-1162