Authors:
Henneuse-Boxus, C
Poleunis, C
De Ro, A
Adriaensen, Y
Bertrand, P
Marchand-Brynaert, J
Citation: C. Henneuse-boxus et al., Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy, SURF INT AN, 27(3), 1999, pp. 142-152