Authors: Robach, O Garreau, Y Aid, K Veron-Jolliot, MB

Citation: O. Robach et al., Corrections for surface X-ray diffraction measurements using the Z-axis geometry: finite size effects in direct and reciprocal space, J APPL CRYS, 33, 2000, pp. 1006-1018

Authors: Coati, A Sauvage-Simkin, M Garreau, Y Pinchaux, R Argunova, T Aid, K

Citation: A. Coati et al., (root 3 x root 3) R30 degrees reconstruction of the 6H-SiC (0001) surface:A simple T4 Si adatom structure solved by grazing-incidence x-ray diffraction, PHYS REV B, 59(19), 1999, pp. 12224-12227

Authors: Aid, K Garreau, Y Sauvage-Simkin, M Pinchaux, R

Citation: K. Aid et al., Atomic structure of the (2 x 4) In0.53Ga0.47As/InP(001) reconstructed surface. A study of average strain and growth temperature effects on the indiumsegregation, SURF SCI, 425(2-3), 1999, pp. 165-173

Authors: Garreau, Y Aid, K Sauvage-Simkin, M Pinchaux, R McConville, CF Jones, TS Sudijono, JL Tok, ES

Citation: Y. Garreau et al., Stoichiometry and discommensuration on InxGa1-xAs/GaAs(001) reconstructed surfaces: A quantitative x-ray diffuse-scattering study, PHYS REV B, 58(24), 1998, pp. 16177-16185