Authors:
Lucadamo, G
Watanabe, M
Barmak, K
Williams, DB
Michaelsen, C
Alani, R
Citation: G. Lucadamo et al., High-resolution quantitative X-ray microanalysis of Nb Al multilayer thin films using the zeta-factor approach, PHIL MAG A, 79(6), 1999, pp. 1423-1442