Authors:
Cremona, M
Mauricio, MHP
Do Carmo, LCS
Prioli, R
Nunes, VB
Zanette, SI
Caride, AO
Albuquerque, MP
Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267