Authors: Cremona, M Mauricio, MHP Do Carmo, LCS Prioli, R Nunes, VB Zanette, SI Caride, AO Albuquerque, MP

Citation: M. Cremona et al., Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data, J MICROSC O, 197, 2000, pp. 260-267