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Universal impurity ionization parameters in MIS C-V freeze-out characteristics and direct extraction of surface doping concentration
Authors: Bouillon, P Gwoziecki, R Skotnicki, T Alieu, J Gentil, P
Citation: P. Bouillon et al., Universal impurity ionization parameters in MIS C-V freeze-out characteristics and direct extraction of surface doping concentration, IEEE DEVICE, 47(4), 2000, pp. 871-877
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