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Results: 1-8 |
Results: 8
Three-domain architecture of stress-free epitaxial ferroelectric films
Authors: Roytburd, AL Alpay, SP Bendersky, LA Nagarajan, V Ramesh, R
Citation: Al. Roytburd et al., Three-domain architecture of stress-free epitaxial ferroelectric films, J APPL PHYS, 89(1), 2001, pp. 553-556
Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films
Authors: Li, H Roytburd, AL Alpay, SP Tran, TD Salamanca-Riba, L Ramesh, R
Citation: H. Li et al., Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films, APPL PHYS L, 78(16), 2001, pp. 2354-2356
Measurement of internal stresses via the polarization in epitaxial ferroelectric films
Authors: Roytburd, AL Alpay, SP Nagarajan, V Ganpule, CS Aggarwal, S Williams, ED Ramesh, R
Citation: Al. Roytburd et al., Measurement of internal stresses via the polarization in epitaxial ferroelectric films, PHYS REV L, 85(1), 2000, pp. 190-193
Role of substrate on the dielectric and piezoelectric behavior of epitaxial lead magnesium niobate-lead titanate relaxor thin films
Authors: Nagarajan, V Alpay, SP Ganpule, CS Nagaraj, BK Aggarwal, S Williams, ED Roytburd, AL Ramesh, R
Citation: V. Nagarajan et al., Role of substrate on the dielectric and piezoelectric behavior of epitaxial lead magnesium niobate-lead titanate relaxor thin films, APPL PHYS L, 77(3), 2000, pp. 438-440
Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effectof internal stresses and dislocation-type defects
Authors: Canedy, CL Li, H Alpay, SP Salamanca-Riba, L Roytburd, AL Ramesh, R
Citation: Cl. Canedy et al., Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effectof internal stresses and dislocation-type defects, APPL PHYS L, 77(11), 2000, pp. 1695-1697
Thickness dependence of structural and electrical properties in epitaxial lead zirconate titanate films
Authors: Nagarajan, V Jenkins, IG Alpay, SP Li, H Aggarwal, S Salamanca-Riba, L Roytburd, AL Ramesh, R
Citation: V. Nagarajan et al., Thickness dependence of structural and electrical properties in epitaxial lead zirconate titanate films, J APPL PHYS, 86(1), 1999, pp. 595-602
Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films
Authors: Alpay, SP Nagarajan, V Bendersky, LA Vaudin, MD Aggarwal, S Ramesh, R Roytburd, AL
Citation: Sp. Alpay et al., Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films, J APPL PHYS, 85(6), 1999, pp. 3271-3277
Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O-3(90%)-PbTiO3(10%) relaxor thin films
Authors: Nagarajan, V Ganpule, CS Nagaraj, B Aggarwal, S Alpay, SP Roytburd, AL Williams, ED Ramesh, R
Citation: V. Nagarajan et al., Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O-3(90%)-PbTiO3(10%) relaxor thin films, APPL PHYS L, 75(26), 1999, pp. 4183-4185
Risultati: 1-8 |