Authors:
Gueorguiev, VK
Ivanov, TE
Dimitriadis, CA
Andreev, SK
Popova, LI
Citation: Vk. Gueorguiev et al., Oxide field enhancement corrected time dependent dielectric breakdown of polyoxides, MICROELEC J, 31(8), 2000, pp. 663-666
Authors:
Gueorguiev, VK
Ivanov, TE
Dimitriadis, CA
Popova, LI
Andreev, SK
Citation: Vk. Gueorguiev et al., Electron trapping probabilities in hydrogen ion implanted silicon dioxide films thermally grown on polycrystalline silicon, MICROELEC J, 31(3), 2000, pp. 207-211