Authors: Belhaj, M Jbara, O Filippov, MN Rau, EI Andrianov, MV

Citation: M. Belhaj et al., Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods, APPL SURF S, 177(1-2), 2001, pp. 58-65

Authors: Jbara, O Belhaj, M Odof, S Msellak, K Rau, EI Andrianov, MV

Citation: O. Jbara et al., Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications, REV SCI INS, 72(3), 2001, pp. 1788-1795

Authors: Belhaj, M Jbara, O Odof, S Msellak, K Rau, EI Andrianov, MV

Citation: M. Belhaj et al., An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect, SCANNING, 22(6), 2000, pp. 352-356