Authors: Tutov, EA Andryukov, AY Bormontov, EN

Citation: Ea. Tutov et al., Adsorption-based porosimetry using capacitance measurements, SEMICONDUCT, 35(7), 2001, pp. 816-820

Authors: Tutov, EA Andryukov, AY Kashkarov, VM

Citation: Ea. Tutov et al., Structural-phase parameters found for porous silicon from capacitance measurements, RUS J AP CH, 73(7), 2000, pp. 1133-1135

Authors: Tutov, EA Andryukov, AY Ryabtsev, SV

Citation: Ea. Tutov et al., Nonequilibrium processes in capacitive sensors based on porous silicon, TECH PHYS L, 26(9), 2000, pp. 778-780

Authors: Tutov, EA Ryabtsev, SV Andryukov, AY

Citation: Ea. Tutov et al., Detection of nitrogen dioxide by amorphous films of tungsten trioxide, TECH PHYS L, 26(2), 2000, pp. 109-111