Authors:
Szuszkiewicz, W
Bak-Misiuk, J
Dynowska, E
Jouanne, M
Morhange, JF
Wissmann, H
Anh, TT
von Ortenberg, M
Citation: W. Szuszkiewicz et al., Structural characterization of MBE-grown HgSe : Fe layers: X-ray diffraction and Raman spectroscopy, J CRYST GR, 214, 2000, pp. 269-274