Authors: Arutyunov, PA

Citation: Pa. Arutyunov, Indirect measurements in finite fields, MEAS TECH R, 42(4), 1999, pp. 324-331

Authors: Tolstikhina, AL Arutyunov, PA Klyshinskii, ES

Citation: Al. Tolstikhina et al., Development of an expert system for interpreting electron diffraction patterns, CRYSTALLO R, 43(6), 1998, pp. 945-949