Authors: Pantel, R Torres, J Paniez, P Auvert, G

Citation: R. Pantel et al., Physical and chemical analysis of advanced interconnections using energy filtering transmission electron microscopy, MICROEL ENG, 50(1-4), 2000, pp. 277-284

Authors: Pantel, R Mascarin, G Auvert, G

Citation: R. Pantel et al., Circuit failure identification using focused ion beam and transmission electron microscopy characterisation techniques., MICROEL ENG, 49(1-2), 1999, pp. 181-189