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Results:
1-9
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Results: 9
Authors:
BERGOSSI O
BACHELOT R
WIOLAND H
WURTZ G
LADDADA R
ADAM PM
BIJEON JL
ROYER P
Citation: O. Bergossi et al., NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH STM AND AFM PROBES, Acta Physica Polonica. A, 93(2), 1998, pp. 393-398
Authors:
WURTZ G
BACHELOT R
ROYER P
Citation: G. Wurtz et al., A REFLECTION-MODE APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPEDEVELOPED FROM A COMMERCIAL SCANNING PROBE MICROSCOPE, Review of scientific instruments, 69(4), 1998, pp. 1735-1743
Authors:
LAHRECH A
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: A. Lahrech et al., INFRARED NEAR-FIELD IMAGING OF IMPLANTED SEMICONDUCTORS - EVIDENCE OFA PURE DIELECTRIC CONTRAST, Applied physics letters, 71(5), 1997, pp. 575-577
Authors:
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: R. Bachelot et al., REFLECTION-MODE SCANNING NEAR-FIELD OPTICAL MICROSCOPY USING AN APERTURELESS METALLIC TIP, Applied optics, 36(10), 1997, pp. 2160-2170
Authors:
LAHRECH A
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: A. Lahrech et al., INFRARED-REFLECTION-MODE NEAR-FIELD MICROSCOPY USING AN APERTURELESS PROBE WITH A RESOLUTION OF LAMBDA 600/, Optics letters, 21(17), 1996, pp. 1315-1317
Authors:
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: R. Bachelot et al., APERTURELESS NEAR-FIELD OPTICAL MICROSCOPY BY LOCAL PERTURBATION OF ADIFFRACTION SPOT, Ultramicroscopy, 61(1-4), 1995, pp. 111-116
Authors:
GLEYZES P
BOCCARA AC
BACHELOT R
Citation: P. Gleyzes et al., NEAR-FIELD OPTICAL MICROSCOPY USING A METALLIC VIBRATING TIP, Ultramicroscopy, 57(2-3), 1995, pp. 318-322
Authors:
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: R. Bachelot et al., NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT, Optics letters, 20(18), 1995, pp. 1924-1926
Authors:
BACHELOT R
GLEYZES P
BOCCARA AC
Citation: R. Bachelot et al., NEAR-FIELD OPTICAL MICROSCOPY BY LOCAL PERTURBATION OF A DIFFRACTION SPOT, Microscopy microanalysis microstructures, 5(4-6), 1994, pp. 389-397
Risultati:
1-9
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