Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
ELECTROMIGRATION IN THIN-FILMS FOR MICROELECTRONICS
Authors:
BALDINI GL DEMUNARI I SCORZONI A FANTINI F
Citation:
Gl. Baldini et al., ELECTROMIGRATION IN THIN-FILMS FOR MICROELECTRONICS, Microelectronics and reliability, 33(11-12), 1993, pp. 1779-1805
RESISTANCE DECAY AFTER ELECTROMIGRATION AS THE EFFECT OF MECHANICAL-STRESS RELAXATION
Authors:
BALDINI GL SCORZONI A TAMARRI F
Citation:
Gl. Baldini et al., RESISTANCE DECAY AFTER ELECTROMIGRATION AS THE EFFECT OF MECHANICAL-STRESS RELAXATION, Microelectronics and reliability, 33(11-12), 1993, pp. 1841-1844
Risultati:
1-2
|