Authors: BALDINI GL DEMUNARI I SCORZONI A FANTINI F

Citation: Gl. Baldini et al., ELECTROMIGRATION IN THIN-FILMS FOR MICROELECTRONICS, Microelectronics and reliability, 33(11-12), 1993, pp. 1779-1805

Authors: BALDINI GL SCORZONI A TAMARRI F

Citation: Gl. Baldini et al., RESISTANCE DECAY AFTER ELECTROMIGRATION AS THE EFFECT OF MECHANICAL-STRESS RELAXATION, Microelectronics and reliability, 33(11-12), 1993, pp. 1841-1844