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Results:
1-7
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Results: 7
Authors:
BARBE DF
Citation: Df. Barbe, CHARGE-COUPLED-DEVICE (CCD) IMAGERS - INVITED PAPER, Journal of information recording, 23(6), 1997, pp. 491
Authors:
ABOUAUF AA
BARBE DF
RUSHDI MM
Citation: Aa. Abouauf et al., WORST-CASE TEST VECTORS FOR FUNCTIONAL FAILURE INDUCED BY TOTAL-DOSE IN CMOS MICROCIRCUITS WITH TRANSMISSION GATES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2013-2017
Authors:
SHU LH
CHRISTOU A
BARBE DF
Citation: Lh. Shu et al., HIGH-TEMPERATURE DEVICE SIMULATION AND THERMAL-CHARACTERISTICS OF GAAS-MESFETS ON CVD DIAMOND SUBSTRATES, Microelectronics and reliability, 36(9), 1996, pp. 1177-1189
Authors:
GUAN L
CHRISTOU A
HALKIAS G
BARBE DF
Citation: L. Guan et al., MODELING OF CURRENT-VOLTAGE CHARACTERISTICS FOR STRAINED AND LATTICE-MATCHED HEMTS ON INP SUBSTRATE USING A VARIATIONAL CHARGE CONTROL MODEL, I.E.E.E. transactions on electron devices, 42(4), 1995, pp. 612-617
Authors:
HENRICKSON LE
GLICK AJ
BRYANT GW
BARBE DF
Citation: Le. Henrickson et al., NONEQUILIBRIUM-GREENS-FUNCTION THEORY OF TRANSPORT IN INTERACTING QUANTUM DOTS, Physical review. B, Condensed matter, 50(7), 1994, pp. 4482-4496
Authors:
ABOUAUF AA
BARBE DF
EISEN HA
Citation: Aa. Abouauf et al., A METHODOLOGY FOR THE IDENTIFICATION OF WORST-CASE TEST VECTORS FOR LOGICAL FAULTS INDUCED IN CMOS CIRCUITS BY TOTAL-DOSE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2585-2592
Authors:
PECHT MG
SHE JY
BARBE DF
Citation: Mg. Pecht et al., EVALUATING TERMINAL PAIR SYSTEM RELIABILITY, IEICE transactions on fundamentals of electronics, communications and computer science, E76A(4), 1993, pp. 555-564
Risultati:
1-7
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