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Results:
1-16
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Results: 16
Authors:
BARCHIESI D
BERGOSSI O
PIERALLI C
SPAJER M
Citation: D. Barchiesi et al., REFLECTION SCANNING NEAR-FIELD OPTICAL MICROSCOPY (R-SNOM) IN CONSTANT HEIGHT MODE WITH A DIELECTRIC PROBE - IMAGE INTERPRETATION AND RESOLUTION FOR HIGH TOPOGRAPHIC VARIATIONS, Ultramicroscopy, 71(1-4), 1998, pp. 361-370
Authors:
BARCHIESI D
Citation: D. Barchiesi, PSEUDOMODULATION TRANSFER-FUNCTION IN REFLECTION SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Optics communications, 154(4), 1998, pp. 167-172
Authors:
BARCHIESI D
Citation: D. Barchiesi, APPLICATION OF FOURIER ALGORITHM TO NEAR-FIELD OPTICAL-IMAGES - LOCALRESOLUTION ESTIMATION, Microscopy microanalysis microstructures, 8(1), 1997, pp. 1-10
Authors:
PAGNOT T
BARCHIESI D
VANLABEKE D
PIERALLI C
Citation: T. Pagnot et al., USE OF A SCANNING NEAR-FIELD OPTICAL MICROSCOPE ARCHITECTURE TO STUDYFLUORESCENCE AND ENERGY-TRANSFER NEAR A METAL, Optics letters, 22(2), 1997, pp. 120-122
Authors:
BARCHIESI D
BERGOSSI O
SPAJER M
PIERALLI C
Citation: D. Barchiesi et al., IMAGE-RESOLUTION IN REFLECTION SCANNING NEAR-FIELD OPTICAL MICROSCOPYUSING SHEAR-FORCE FEEDBACK - CHARACTERIZATION WITH A SPLINE AND FOURIER SPECTRUM, Applied optics, 36(10), 1997, pp. 2171-2177
Authors:
BARCHIESI D
GIRARD C
MARTIN OJF
VANLABEKE D
COURJON D
Citation: D. Barchiesi et al., COMPUTING THE OPTICAL NEAR-FIELD DISTRIBUTIONS AROUND COMPLEX SUBWAVELENGTH SURFACE-STRUCTURES - A COMPARATIVE-STUDY OF DIFFERENT METHODS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 54(4), 1996, pp. 4285-4292
Authors:
BARCHIESI D
Citation: D. Barchiesi, A 3-D MULTILAYER MODEL OF SCATTERING BY NANOSTRUCTURES - APPLICATION TO THE OPTIMIZATION OF THIN COATED NANO-SOURCES, Optics communications, 126(1-3), 1996, pp. 7-13
Authors:
VANLABEKE D
BARCHIESI D
BAIDA F
Citation: D. Vanlabeke et al., OPTICAL CHARACTERIZATION OF NANOSOURCES USED IN SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(4), 1995, pp. 695-703
Authors:
BARCHIESI D
VANLABEKE D
Citation: D. Barchiesi et D. Vanlabeke, THE INVERSE SCANNING TUNNELING NEAR-FIELD MICROSCOPE (ISTOM) OR TUNNEL SCANNING NEAR-FIELD OPTICAL MICROSCOPE (TSNOM) 3D SIMULATIONS AND APPLICATION TO NANO-SOURCES, Ultramicroscopy, 61(1-4), 1995, pp. 17-20
Authors:
VANLABEKE D
VIAL A
BARCHIESI D
Citation: D. Vanlabeke et al., NEAR-FIELD THEORETICAL-STUDY OF A MAGNETOOPTICAL GRATING, Ultramicroscopy, 61(1-4), 1995, pp. 51-55
Authors:
BARCHIESI D
VANLABEKE D
Citation: D. Barchiesi et D. Vanlabeke, A PERTURBATIVE DIFFRACTION THEORY OF A MULTILAYER SYSTEM - APPLICATIONS TO NEAR-FIELD OPTICAL MICROSCOPY SNOM AND STOM, Ultramicroscopy, 57(2-3), 1995, pp. 196-203
Authors:
VANLABEKE D
BAIDA F
BARCHIESI D
COURJON D
Citation: D. Vanlabeke et al., A THEORETICAL-MODEL FOR THE INVERSE SCANNING TUNNELING OPTICAL MICROSCOPE (ISTOM), Optics communications, 114(5-6), 1995, pp. 470-480
Authors:
BARCHIESI D
VANLABEKE D
Citation: D. Barchiesi et D. Vanlabeke, PSTM - AN ALTERNATIVE TO MEASURE LOCAL VARIATION OF OPTICAL INDEX, Microscopy microanalysis microstructures, 5(4-6), 1994, pp. 435-446
Authors:
BARCHIESI D
VANLABEKE D
Citation: D. Barchiesi et D. Vanlabeke, A MODEL IN SNOM - INFLUENCE OF METALLIZAT ION AND OF TIP GEOMETRY, Microscopy microanalysis microstructures, 5(1), 1994, pp. 1-10
Authors:
BARCHIESI D
VANLABEKE D
Citation: D. Barchiesi et D. Vanlabeke, APPLICATION OF MIE SCATTERING OF EVANESCENT WAVES TO SCANNING TUNNELING OPTICAL MICROSCOPY THEORY, J. mod. opt., 40(7), 1993, pp. 1239-1254
Authors:
VANLABEKE D
BARCHIESI D
Citation: D. Vanlabeke et D. Barchiesi, PROBES FOR SCANNING TUNNELING OPTICAL MICROSCOPY - A THEORETICAL COMPARISON, Journal of the Optical Society of America. A: Optics and image science, 10(10), 1993, pp. 2193-2201
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1-16
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