THE INVERSE SCANNING TUNNELING NEAR-FIELD MICROSCOPE (ISTOM) OR TUNNEL SCANNING NEAR-FIELD OPTICAL MICROSCOPE (TSNOM) 3D SIMULATIONS AND APPLICATION TO NANO-SOURCES

Authors
BARCHIESI D VANLABEKE D
Citation
D. Barchiesi et D. Vanlabeke, THE INVERSE SCANNING TUNNELING NEAR-FIELD MICROSCOPE (ISTOM) OR TUNNEL SCANNING NEAR-FIELD OPTICAL MICROSCOPE (TSNOM) 3D SIMULATIONS AND APPLICATION TO NANO-SOURCES, Ultramicroscopy, 61(1-4), 1995, pp. 17-20
Citations number
11
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
61
Issue
1-4
Year of publication
1995
Pages
17 - 20
Database
ISI
SICI code
0304-3991(1995)61:1-4<17:TISTNM>2.0.ZU;2-K
Abstract
We propose an application of the ISTOM to characterize nano-sources us ed in Scanning Near-Field Microscopies. The model takes into account t he coupling between the nano-source and the hemispherical lens of the ISTOM set-up. By changing the angle of detection, experimental data ar e related to the Fourier spectrum of the source. We show ''images'' ca lculated with two different distances between tip end and lens surface .