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Results: 1-25/847
Authors:
MIDGLEY PA
SLEIGHT ME
SAUNDERS M
VINCENT R
Citation: Pa. Midgley et al., MEASUREMENT OF DEBYE-WALLER FACTORS BY ELECTRON PRECESSION, Ultramicroscopy, 75(2), 1998, pp. 61-67
Authors:
LEE I
CHAN KY
PHILLIPS DL
Citation: I. Lee et al., ATOMIC-FORCE MICROSCOPY OF PLATINUM NANOPARTICLES PREPARED ON HIGHLY ORIENTED PYROLYTIC-GRAPHITE, Ultramicroscopy, 75(2), 1998, pp. 69-76
Authors:
PLASCHKE M
ROMER J
KIM JI
Citation: M. Plaschke et al., ALIGNMENT OF IN-SITU AFM IMAGES USING MICROSTRUCTURED REFERENCE POINTS, Ultramicroscopy, 75(2), 1998, pp. 77-83
Authors:
SCHNEIDER G
Citation: G. Schneider, CRYO X-RAY MICROSCOPY WITH HIGH-SPATIAL-RESOLUTION IN AMPLITUDE AND PHASE-CONTRAST, Ultramicroscopy, 75(2), 1998, pp. 85-104
Authors:
FROST BG
Citation: Bg. Frost, AN ELECTRON HOLOGRAPHIC STUDY OF ELECTRIC CHARGING AND ELECTRIC CHARGE-DISTRIBUTIONS, Ultramicroscopy, 75(2), 1998, pp. 105-113
Authors:
HAWKES PW
Citation: Pw. Hawkes, JOURNEYS END IN MICROSCOPISTS MEETINGS, Ultramicroscopy, 75(2), 1998, pp. 115-135
Authors:
SPATZ JP
SHEIKO SS
MOLLER M
Citation: Jp. Spatz et al., SHAPE AND QUALITY-CONTROL OF MODIFIED SCANNING FORCE MICROSCOPY TIPS, Ultramicroscopy, 75(1), 1998, pp. 1-4
Authors:
INOUE M
SUZUKI K
AMASUGA H
NAKAMURA M
MERA Y
TAKEUCHI S
MAEDA K
Citation: M. Inoue et al., RELIABLE IMAGE-PROCESSING THAT CAN EXTRACT AN ATOMICALLY-RESOLVED LINE-SHAPE OF PARTIAL DISLOCATIONS IN SEMICONDUCTORS FROM PLAN-VIEW HIGH-RESOLUTION ELECTRON-MICROSCOPIC IMAGES, Ultramicroscopy, 75(1), 1998, pp. 5-14
Authors:
TROYON M
PASTRE D
JOUART JP
BEAUDOIN JL
Citation: M. Troyon et al., SCANNING NEAR-FIELD CATHODOLUMINESCENCE MICROSCOPY, Ultramicroscopy, 75(1), 1998, pp. 15-21
Authors:
MEYER RR
KIRKLAND A
Citation: Rr. Meyer et A. Kirkland, THE EFFECTS OF ELECTRON AND PHOTON SCATTERING ON SIGNAL AND NOISE TRANSFER PROPERTIES OF SCINTILLATORS IN CCD CAMERAS USED FOR ELECTRON DETECTION, Ultramicroscopy, 75(1), 1998, pp. 23-33
Authors:
GUNTHER S
KOLMAKOV A
KOVAC J
KISKINOVA M
Citation: S. Gunther et al., ARTIFACT FORMATION IN SCANNING PHOTOELECTRON EMISSION MICROSCOPY, Ultramicroscopy, 75(1), 1998, pp. 35-51
Authors:
HAIDER M
ROSE H
UHLEMANN S
SCHWAN E
KABIUS B
URBAN K
Citation: M. Haider et al., A SPHERICAL-ABERRATION-CORRECTED 200 KV TRANSMISSION ELECTRON-MICROSCOPE, Ultramicroscopy, 75(1), 1998, pp. 53-60
Authors:
SHEGELSKI MRA
FALTUS S
CLARK T
KREUZER HJ
Citation: Mra. Shegelski et al., IMPROVEMENTS IN THE RECONSTRUCTION OF IN-LINE HOLOGRAMS BY ENERGY SAMPLING AND TOMOGRAPHY, Ultramicroscopy, 74(4), 1998, pp. 169-178
Authors:
SHERMAN MB
SOEJIMA T
CHIU W
VANHEEL M
Citation: Mb. Sherman et al., MULTIVARIATE-ANALYSIS OF SINGLE-UNIT CELLS IN ELECTRON CRYSTALLOGRAPHY, Ultramicroscopy, 74(4), 1998, pp. 179-199
Authors:
BOISSET N
PENCZEK PA
TAVEAU JC
YOU V
DEHAAS F
LAMY J
Citation: N. Boisset et al., OVERABUNDANT SINGLE-PARTICLE ELECTRON-MICROSCOPE VIEWS INDUCE A 3-DIMENSIONAL RECONSTRUCTION ARTIFACT, Ultramicroscopy, 74(4), 1998, pp. 201-207
Authors:
CHENG YF
TAYLOR KA
Citation: Yf. Cheng et Ka. Taylor, CHARACTERIZATION OF THE LOW MAGNIFICATION PERFORMANCE OF A PHILIPS CM300-FEG, Ultramicroscopy, 74(4), 1998, pp. 209-220
Authors:
MILLER PD
GIBSON JM
Citation: Pd. Miller et Jm. Gibson, CONNECTING SMALL-ANGLE DIFFRACTION WITH REAL-SPACE IMAGES BY QUANTITATIVE TRANSMISSION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS, Ultramicroscopy, 74(4), 1998, pp. 221-235
Authors:
CHUNG WF
ALTMAN MS
Citation: Wf. Chung et Ms. Altman, STEP CONTRAST IN LOW-ENERGY-ELECTRON MICROSCOPY, Ultramicroscopy, 74(4), 1998, pp. 237-246
Authors:
LENZ F
LICHTE H
Citation: F. Lenz et H. Lichte, IN MEMORY OF MOLLENSTEDT,GOTTFRIED, Ultramicroscopy, 74(3), 1998, pp. 95-103
Authors:
HU JJ
TANAKA N
Citation: Jj. Hu et N. Tanaka, AN APPROXIMATE MULTIBEAM FORM OF THE ELLIPSE IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Ultramicroscopy, 74(3), 1998, pp. 105-111
Authors:
HEINEMANN D
MADER W
Citation: D. Heinemann et W. Mader, ELECTRON-SCATTERING EXPERIMENTS USING A POSTCOLUMN IMAGING ELECTRON-ENERGY FILTER, Ultramicroscopy, 74(3), 1998, pp. 113-122
Authors:
HUANG X
LIU Q
Citation: X. Huang et Q. Liu, DETERMINATION OF CRYSTALLOGRAPHIC AND MACROSCOPIC ORIENTATION OF PLANAR STRUCTURES IN TEM, Ultramicroscopy, 74(3), 1998, pp. 123-130
Authors:
HYTCH MJ
SNOECK E
KILAAS R
Citation: Mj. Hytch et al., QUANTITATIVE MEASUREMENT OF DISPLACEMENT AND STRAIN FIELDS FROM HREM MICROGRAPHS, Ultramicroscopy, 74(3), 1998, pp. 131-146
Authors:
BERG BS
HANSEN V
MIDGLEY PA
GJONNES J
Citation: Bs. Berg et al., MEASUREMENT OF 3-DIMENSIONAL INTENSITY DATA IN ELECTRON-DIFFRACTION BY THE PRECESSION TECHNIQUE, Ultramicroscopy, 74(3), 1998, pp. 147-157
Authors:
GRIGIS C
SCHAMM S
Citation: C. Grigis et S. Schamm, ELEMENT AND PHASE IDENTIFICATION VIA FINE-STRUCTURE ANALYSIS IN EELS - APPLICATION TO MOCVD-Y1BA2CU3O7-DELTA THIN-FILMS, Ultramicroscopy, 74(3), 1998, pp. 159-167