MEASUREMENT OF DEBYE-WALLER FACTORS BY ELECTRON PRECESSION

Citation
Pa. Midgley et al., MEASUREMENT OF DEBYE-WALLER FACTORS BY ELECTRON PRECESSION, Ultramicroscopy, 75(2), 1998, pp. 61-67
Citations number
16
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
75
Issue
2
Year of publication
1998
Pages
61 - 67
Database
ISI
SICI code
0304-3991(1998)75:2<61:MODFBE>2.0.ZU;2-B
Abstract
The electron precession technique was developed for the ab initio stru cture determination of unknown phases. However, in this paper we have explored the possibility of using precession to determine accurate val ues of the Debye-Waller factor. As a test of the technique, silicon, d iamond and chromium were studied and the results obtained compared wit h known values determined from other techniques. The agreement was fou nd to be excellent. The accuracy and simplicity of the technique makes it suited to many situations where the Debye-Waller factor needs to b e known accurately and with sub-micron spatial resolution. (C) 1998 El sevier Science B.V. All rights reserved.