AN APPROXIMATE MULTIBEAM FORM OF THE ELLIPSE IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

The concept of ''ellipse'', appearing in recent studies of high-resolu tion transmission electron microscopy, is newly defined as the curves in the Fourier transform patterns of the images caused by many beams b y plotting the intensities of diffracted beams vs. the transmitted bea m. The present approximate ellipsoidal path can also be derived by usi ng the phase-grating approximation and Sayre's relation, but without t he two-Bloch-waves assumption. Its validity is examined from the data obtained by Fourier transforming the multi-slice simulated images of s ilicon [110], and gives a valuable issue for quantitative image analys is in diffraction space. (C) 1998 Elsevier Science B.V. All rights res erved.