Authors: MATTHEE T WECKER J BARDAL A SAMWER K

Citation: T. Matthee et al., EPITAXIAL AND THERMAL STRAINS IN OXIDIC THIN-FILMS ON SI(001), Thin solid films, 258(1-2), 1995, pp. 264-267

Authors: BARDAL A MATTHEE T WECKER J SAMWER K

Citation: A. Bardal et al., INITIAL-STAGES OF EPITAXIAL-GROWTH OF Y-STABILIZED ZRO2 THIN-FILMS ONA-SIOX SI(001) SUBSTRATES/, Journal of applied physics, 75(6), 1994, pp. 2902-2910

Authors: BARDAL A EIBL O

Citation: A. Bardal et O. Eibl, THE INTERFACIAL ATOMIC-STRUCTURE OF EPITAXIAL YBCO THIN-FILMS ON Y2O3, Physica. C, Superconductivity, 216(3-4), 1993, pp. 365-381

Authors: BARDAL A EIBL O MATTHEE T FRIEDL G WECKER J

Citation: A. Bardal et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY OF EPITAXIAL YBCO Y2O3/YSZ ON SI(001)/, Journal of materials research, 8(9), 1993, pp. 2112-2127

Authors: BARDAL A

Citation: A. Bardal, THE EFFECT OF ANTIMONY ON THE INTERFACES OF CAST ALSI-SIC COMPOSITES, Journal of Materials Science, 28(10), 1993, pp. 2699-2705

Authors: GONG ZH VASSENDEN F FAGERBERG R GREPSTAD JK BARDAL A HOIER R

Citation: Zh. Gong et al., PROCESSING DEPENDENCE OF THE INTERFACIAL MICROSTRUCTURE OF AG CONTACTS TO YBA2CU3O7-DELTA THIN-FILMS, Applied physics letters, 63(6), 1993, pp. 836-838