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Citation: M. Goldberg et al., CATHODOLUMINESCENCE DEPTH ANALYSIS IN SIO2-SI-SYSTEMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 560-561

Authors: MYINT K BARFELS T KUHR JC FITTING HJ

Citation: K. Myint et al., EDX DEPTH PROFILING BY MEANS OF EFFECTIVE LAYERS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 637-639

Authors: FITTING HJ KUHR JC GOLDBERG M BECHER B BARFELS T

Citation: Hj. Fitting et al., EDX DEPTHS ANALYSIS OF MIS-STRUCTURES, Mikrochimica acta, 125(1-4), 1997, pp. 235-238