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Results: 1-7 |
Results: 7
THIN SAMPLE THICKNESS DETERMINATION BY X-RAY-FLUORESCENCE ANALYSIS
Authors: BARREA RA DEROSA PA BENGIO S MAINARDI RT
Citation: Ra. Barrea et al., THIN SAMPLE THICKNESS DETERMINATION BY X-RAY-FLUORESCENCE ANALYSIS, Radiation physics and chemistry, 51(4-6), 1998, pp. 673-673
ABSOLUTE MASS THICKNESS DETERMINATION OF THIN SAMPLES BY X-RAY-FLUORESCENCE ANALYSIS
Authors: BARREA RA BENGIO S DEROSA PA MAINARDI RT
Citation: Ra. Barrea et al., ABSOLUTE MASS THICKNESS DETERMINATION OF THIN SAMPLES BY X-RAY-FLUORESCENCE ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 143(4), 1998, pp. 561-568
PARAMETRIC EQUATION FOR THE EFFICIENCY CURVE OF GERMANIUM DETECTORS
Authors: MARTINEZ VD MAINARDI RT BARREA RA HIDALGO CM DEROSA PA ARBOLI MM
Citation: Vd. Martinez et al., PARAMETRIC EQUATION FOR THE EFFICIENCY CURVE OF GERMANIUM DETECTORS, X-ray spectrometry, 27(5), 1998, pp. 321-324
STANDARDLESS XRF ANALYSIS OF STAINLESS-STEEL SAMPLES
Authors: BARREA RA MAINARDI RT
Citation: Ra. Barrea et Rt. Mainardi, STANDARDLESS XRF ANALYSIS OF STAINLESS-STEEL SAMPLES, X-ray spectrometry, 27(2), 1998, pp. 111-116
INDIRECT METHOD OF X-RAY-SPECTRA DETERMINATION BY XRF
Authors: MAINARDI RT BARREA RA
Citation: Rt. Mainardi et Ra. Barrea, INDIRECT METHOD OF X-RAY-SPECTRA DETERMINATION BY XRF, X-ray spectrometry, 25(4), 1996, pp. 190-195
DETERMINATION OF SPECTRAL EMISSION OF TUNGSTEN TARGET TUBES MEASURINGX-RAY-FLUORESCENCE FROM PURE ELEMENTS
Authors: MAINARDI RT BARREA RA
Citation: Rt. Mainardi et Ra. Barrea, DETERMINATION OF SPECTRAL EMISSION OF TUNGSTEN TARGET TUBES MEASURINGX-RAY-FLUORESCENCE FROM PURE ELEMENTS, Applied radiation and isotopes, 46(6-7), 1995, pp. 497-498
X-RAY-FLUORESCENCE ANALYSIS WITH ELEMENTS HAVING OVERLAPPED LINES
Authors: MAINARDI RT BARREA RA
Citation: Rt. Mainardi et Ra. Barrea, X-RAY-FLUORESCENCE ANALYSIS WITH ELEMENTS HAVING OVERLAPPED LINES, X-ray spectrometry, 23(1), 1994, pp. 36-39
Risultati: 1-7 |