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Results:
1-8
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Results: 8
Authors:
BARTH KL
FUKAREK W
MAUCHER HP
PLASS MF
LUNK A
Citation: Kl. Barth et al., IN-SITU CHARACTERIZATION OF CUBIC BORON-NITRIDE FILM GROWTH IN THE IRSPECTRAL REGION, Thin solid films, 313, 1998, pp. 697-703
Authors:
BARTH KL
LUNK A
ULMER J
Citation: Kl. Barth et al., INFLUENCE OF THE DEPOSITION PARAMETERS ON BORON-NITRIDE GROWTH MECHANISMS IN A HOLLOW-CATHODE ARE EVAPORATION DEVICE, Surface & coatings technology, 92(1-2), 1997, pp. 96-103
Authors:
BARTH KL
SIGLE W
STOCKLE D
ULMER J
LUNK A
Citation: Kl. Barth et al., DEPOSITION OF CUBIC BORON-NITRIDE LAYERS - CHARACTERIZATION OF SUBSTRATE-LAYER INTERFACE, Thin solid films, 301(1-2), 1997, pp. 65-70
Authors:
BARTH KL
NEUFFER A
ULMER J
LUNK A
Citation: Kl. Barth et al., DEPOSITION OF C-BN FILMS IN A HOLLOW-CATHODE ARC EVAPORATION DEVICE, DIAMOND AND RELATED MATERIALS, 5(11), 1996, pp. 1270-1274
Authors:
BARTH KL
SAMPATH WS
Citation: Kl. Barth et Ws. Sampath, ENVIRONMENTALLY BENIGN VACUUM DEPOSITION WITH AIR-TO-VACUUM-TO-AIR TECHNOLOGY, Journal of materials research, 10(3), 1995, pp. 493-496
Authors:
BARTH KL
LUNK A
Citation: Kl. Barth et A. Lunk, INFRARED ELLIPSOMETRIC CHARACTERIZATION OF MIXED-PHASE BN LAYERS DEPOSITED BY PLASMA-ENHANCED PHYSICAL VAPOR-DEPOSITION, Surface & coatings technology, 74-5(1-3), 1995, pp. 110-117
Authors:
KAMARAS K
BARTH KL
KEILMANN F
HENN R
REEDYK M
THOMSEN C
CARDONA M
KIRCHER J
RICHARDS PL
STEHLE JL
Citation: K. Kamaras et al., THE LOW-TEMPERATURE INFRARED OPTICAL FUNCTIONS OF SRTIO3 DETERMINED BY REFLECTANCE SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY, Journal of applied physics, 78(2), 1995, pp. 1235-1240
Authors:
BARTH KL
BOHME D
KAMARAS K
KEILMANN F
CARDONA M
Citation: Kl. Barth et al., FAR-IR SPECTROSCOPIC ELLIPSOMETER, Thin solid films, 234(1-2), 1993, pp. 314-317
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1-8
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