Authors: BARTSCHER M BONSE U

Citation: M. Bartscher et U. Bonse, X-RAY-INTERFEROMETRIC DETERMINATION OF ANGSTROM-SCALE LATTICE SHIFTS AT THE SURFACE OF SILICON-CRYSTALS - THE ANALOG TO LIGHT-OPTICAL INTERFERENCE MICROSCOPY, Crystal research and technology, 33(4), 1998, pp. 535-541

Authors: BONSE U UEBBING H BARTSCHER M NUSSHARDT M

Citation: U. Bonse et al., X-RAY AND NEUTRON INTERFEROMETRY AND THE MEASUREMENT OF FUNDAMENTAL CONSTANTS, Metrologia, 31(3), 1994, pp. 195-201