Authors: TURINETTI JR CRITCHFIELD KL CHAVEZ JR KEMP WT BELLEM RD BEUTLER DE

Citation: Jr. Turinetti et al., DETERMINATION OF LOW-ENERGY (LESS-THAN-160-KEV) X-RAY-SPECTRA AND VERIFICATION OF TRANSPORT CALCULATIONS THROUGH SILICON, IEEE transactions on nuclear science, 44(6), 1997, pp. 2065-2070

Authors: TALLON RW KOLLER DC PELZL RM PUGH RD BELLEM RD

Citation: Rw. Tallon et al., 5-KEV TO 160-KEV CONTINUOUS-WAVE X-RAY SPECTRAL ENERGY-DISTRIBUTION AND ENERGY FLUX-DENSITY MEASUREMENTS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2112-2117

Authors: BELLEM RD CRITCHFIELD KL PELZL RM PUGH RD TALLON RW

Citation: Rd. Bellem et al., ANALYTICAL AND EXPERIMENTAL DOSIMETRY TECHNIQUES FOR CALIBRATING A LOW-ENERGY X-RAY-RADIATION SOURCE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2139-2146