Citation: M. Bendada et al., DIODE PARAMETER DETERMINATION AS APPLIED TO MOSFETS FOR RADIATION EFFECTS CHARACTERIZATION, Radiation effects and defects in solids, 132(4), 1994, pp. 355-360
Authors:
LEBRAS L
BENDADA M
MIALHE P
BLAMPAIN E
CHARLES JP
Citation: L. Lebras et al., RECOMBINATION VIA RADIATION-INDUCED DEFECTS IN FIELD-EFFECT TRANSISTOR, Journal of applied physics, 76(10), 1994, pp. 5676-5680