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Authors: KOPANSKI JJ MARCHIANDO JF BERNING DW ALVIS R SMITH HE
Citation: Jj. Kopanski et al., SCANNING CAPACITANCE MICROSCOPY MEASUREMENT OF 2-DIMENSIONAL DOPANT PROFILES ACROSS JUNCTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 339-343

Authors: ADAMS VH BLACKBURN DL JOSHI YK BERNING DW
Citation: Vh. Adams et al., ISSUES IN VALIDATING PACKAGE COMPACT THERMAL MODELS FOR NATURAL-CONVECTION COOLED ELECTRONIC SYSTEMS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(4), 1997, pp. 420-431
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