Authors:
BESSER PR
MARIEB TN
LEE J
FLINN PA
BRAVMAN JC
Citation: Pr. Besser et al., MEASUREMENT AND INTERPRETATION OF STRAIN RELAXATION IN PASSIVATED AL-0.5-PERCENT CU LINES, Journal of materials research, 11(1), 1996, pp. 184-193
Authors:
VENKATRAMAN R
BESSER PR
BRAVMAN JC
BRENNAN S
Citation: R. Venkatraman et al., ELASTIC STRAIN GRADIENTS AND X-RAY-LINE BROADENING EFFECTS AS A FUNCTION OF TEMPERATURE IN ALUMINUM THIN-FILMS ON SILICON, Journal of materials research, 9(2), 1994, pp. 328-335
Citation: Pr. Besser et al., AN X-RAY-METHOD FOR DIRECT DETERMINATION OF THE STRAIN STATE AND STRAIN RELAXATION IN MICRON-SCALE PASSIVATED METALLIZATION LINES DURING THERMAL CYCLING, Journal of materials research, 9(1), 1994, pp. 13-24
Citation: Pr. Besser et al., FINITE-ELEMENT MODELING AND X-RAY-MEASUREMENT OF STRAIN IN PASSIVATEDAL LINES DURING THERMAL CYCLING, Journal of the Electrochemical Society, 140(6), 1993, pp. 1769-1772