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Results: 1-8 |
Results: 8

Authors: BEYERER J
Citation: J. Beyerer, IS IT USEFUL TO KNOW A NUISANCE PARAMETER, Signal processing, 68(1), 1998, pp. 107-111

Authors: BEYERER J LEON FP
Citation: J. Beyerer et Fp. Leon, ADAPTIVE SEPARATION OF RANDOM LINES AND BACKGROUND, Optical engineering, 37(10), 1998, pp. 2733-2741

Authors: BEYERER J LEON FP
Citation: J. Beyerer et Fp. Leon, DETECTION OF DEFECTS IN GROOVE TEXTURES OF HONED SURFACES, International journal of machine tools & manufacture, 37(3), 1997, pp. 371-389

Authors: BEYERER J PERARD D
Citation: J. Beyerer et D. Perard, AUTOMATED INSPECTION OF SPECULAR SURFACES BY MEANS OF PATTERN REFLECTIONS, TM. Technisches Messen, 64(10), 1997, pp. 394-400

Authors: BEYERER J TRACHTLER A
Citation: J. Beyerer et A. Trachtler, SIMPLE MEASURE FOR THE AMOUNT OF INFORMATION OF MEASUREMENT SYSTEMS, TM. Technisches Messen, 64(10), 1997, pp. 401-407

Authors: BEYERER J LEON FP
Citation: J. Beyerer et Fp. Leon, SUPPRESSION OF INHOMOGENEITIES IN IMAGES OF TEXTURED SURFACES, Optical engineering, 36(1), 1997, pp. 85-93

Authors: BEYERER J
Citation: J. Beyerer, MODEL-BASED INSPECTION OF MACHINED SURFAC ES, TM. Technisches Messen, 63(5), 1996, pp. 182-190

Authors: BEYERER J
Citation: J. Beyerer, DETECTION OF MILLING TOOL DAMAGES BY ANAL YZING THE WORKPIECE TEXTURE, TM. Technisches Messen, 60(11), 1993, pp. 419-424
Risultati: 1-8 |