Authors: NIPOTI R BIANCONI MSM MILITA S

Citation: R. Nipoti et al., DAMAGE PROFILES IN AS-IMPLANTED (100) SI CRYSTALS - STRAIN BY X-RAY-DIFFRACTOMETRY VERSUS INTERSTITIALS BY RBS-CHANNELING (VOL 120, PG 64, 1996), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(4), 1997, pp. 699-699