Authors:
STAUFFER L
VAN S
BOLMONT D
KOULMANN JJ
MINOT C
Citation: L. Stauffer et al., 1ST STAGES OF GE ADSORPTION ON THE SI(111)7X7 SURFACE - EXPERIMENTAL AND THEORETICAL-STUDIES, Surface science, 309, 1994, pp. 274-279
Authors:
MEHDAOUI A
BOLMONT D
DANESI P
BOURGAULT D
LOEGEL B
Citation: A. Mehdaoui et al., INFLUENCE OF PROCESSING ON THE LOW-FIELD MAGNETIC PHASE-DIAGRAM OF HIGH-TEMPERATURE SUPERCONDUCTORS, Superconductor science and technology, 6(5), 1993, pp. 322-326
Authors:
MEHDAOUI A
DANESI P
BOLMONT D
BOURGAULT D
LOEGEL B
Citation: A. Mehdaoui et al., IRREVERSIBILITY AND CRITICAL LINES IN TEXTURED HIGH-TEMPERATURE SUPERCONDUCTORS - EFFECTS OF PROCESSING ON THE MAGNETIC PHASE-DIAGRAM, Journal of alloys and compounds, 195(1-2), 1993, pp. 459-462
Authors:
LOEGEL B
MEHDAOUI A
BOLMONT D
DANESI P
BOURGAULT D
TOURNIER R
Citation: B. Loegel et al., IRREVERSIBILITY LINE AND ANISOTROPY OF MAGNETIC MELT-TEXTURED Y1BA2CU3O7-DELTA STUDIED BY AC SUSCEPTIBILITY, Physica. C, Superconductivity, 210(3-4), 1993, pp. 432-438
Citation: F. Lutz et al., AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE THERMAL-OXIDATION AND NITRIDATION OF SI(100)-2X1 BY NO2, Applied surface science, 72(4), 1993, pp. 427-433
Citation: M. Diani et al., X-RAY PHOTOELECTRON DIFFRACTION OBSERVATION OF BETA-SIC(001) OBTAINEDBY ELECTRON-CYCLOTRON-RESONANCE PLASMA-ASSISTED GROWTH ON SI(001), Applied surface science, 68(4), 1993, pp. 575-582
Authors:
STAUFFER L
MHARCHI A
PIRRI C
WETZEL P
BOLMONT D
GEWINNER G
MINOT C
Citation: L. Stauffer et al., ELECTRONIC-STRUCTURE AND INTERFACIAL GEOMETRY OF EPITAXIAL 2-DIMENSIONAL ER SILICIDE ON SI(111), Physical review. B, Condensed matter, 47(16), 1993, pp. 10555-10562
Authors:
BISCHOFF JL
KUBLER L
BOLMONT D
SEBENNE CA
LACHARME JP
BONNET JE
HRICOVINI K
Citation: Jl. Bischoff et al., A PHOTOEMISSION-STUDY OF AMMONIA ADSORPTION ON SI(100)2X1 AND SI(111)2X1 SURFACES, Surface science, 293(1-2), 1993, pp. 35-40
Authors:
DIANI M
AUBEL D
BISCHOFF JL
KUBLER L
BOLMONT D
Citation: M. Diani et al., THE GE STRANSKI-KRASTANOV GROWTH MODE ON SI(001)(2X1) TESTED BY X-RAYPHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION, Surface science, 291(1-2), 1993, pp. 110-116
Authors:
ROUYER D
KREMBEL C
HANF MC
BOLMONT D
GEWINNER G
Citation: D. Rouyer et al., X-RAY PHOTOELECTRON DIFFRACTION FROM ULTRA-THIN CR LAYERS ON AU(100) AND AG(100) - A COMPARISON, Surface science, 287, 1993, pp. 935-940
Citation: M. Diani et al., X-RAY PHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION PROBING OF GE HETEROEPITAXY ON SI (001) 2X1, Journal of applied physics, 73(11), 1993, pp. 7412-7415