Authors: BOLOTOV LN VAKAR Z GALL NR MAKARENKO IV RUTKOV EV TITKOV AN TONTEGODE AY USUFOV MM

Citation: Ln. Bolotov et al., TOPOGRAPHIC STUDY BY SCANNING-TUNNELING-MICROSCOPY OF A 2-DIMENSIONALGRAPHITE FILM ON RE(10(1)OVER-BAR0), Physics of the solid state, 40(8), 1998, pp. 1423-1426

Authors: BOLOTOV LN MAKARENKO IB TIMKOV AN VEKSLER MI GREKHOV IV SHULEKIN AF

Citation: Ln. Bolotov et al., STM-CONTACT WITH HYDROGEN-PASSIVATED N-TY PE SILICON SURFACE AS THE POINTED AUGER-TRANSISTOR WITH TUNNEL MOS-EMITTER, Fizika tverdogo tela, 38(3), 1996, pp. 889-900

Authors: BOLOTOV LN MAKARENKO IV SHULEKIN AF TITKOV AN

Citation: Ln. Bolotov et al., MINORITY-CARRIERS CONTRIBUTION AND HOT-ELECTRON INJECTION PROCESS IN TUNNEL SPECTROSCOPY OF H-PASSIVATED SILICON SURFACES, Surface science, 333, 1995, pp. 468-472

Authors: BOLOTOV LN KOZLOV VA MAKARENKO IV TITKOV AN

Citation: Ln. Bolotov et al., VISUALIZATION OF THE (111) SURFACE OF P-TYPE SILICON DISKS UNDER ATMOSPHERIC CONDITIONS WITH USE OF A SCANNING TUNNELING MICROSCOPE, Semiconductors, 27(8), 1993, pp. 760-762