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Results: 1-4 |
Results: 4

Authors: BOUDET T BERGER M LARTIGUE O HIRRIEN B
Citation: T. Boudet et al., OPTICAL AND X-RAY CHARACTERIZATION APPLIED TO MULTILAYER REVERSE ENGINEERING, Optical engineering, 37(7), 1998, pp. 2175-2181

Authors: BERTIN F CHABLI A CHIARIGLIONE E BURDIN M BERGER M BOUDET T LARTIGUE O RAVEL G
Citation: F. Bertin et al., SPECTROSCOPIC ELLIPSOMETRY WITH COMPENSATOR AND X-RAY SPECULAR REFLECTIVITY FOR CHARACTERIZATION OF THIN OPTICAL-LAYERS ON TRANSPARENT SUBSTRATES, Thin solid films, 313, 1998, pp. 68-72

Authors: LUPASCU A KEVORKIAN A BOUDET T SAINTANDRE F PERSEGOL D LEVY M
Citation: A. Lupascu et al., MODELING ION-EXCHANGE IN GLASS WITH CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS AND MOBILITIES, Optical engineering, 35(6), 1996, pp. 1603-1610

Authors: BOUDET T CHATON P HERAULT L GONON G JOUANET L KELLER P
Citation: T. Boudet et al., THIN-FILM DESIGNS BY SIMULATED ANNEALING, Applied optics, 35(31), 1996, pp. 6219-6226
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