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Authors: BOUKEZZATA M BIROUK B MANSOUR F BIELLEDASPET D
Citation: M. Boukezzata et al., STRUCTURAL AND ELECTRICAL CHANGES IN POLYCRYSTALLINE SILICON THIN-FILMS THAT ARE HEAVILY IN-SITU BORON-DOPED AND THERMALLY OXIDIZED WITH DRY OXYGEN, CHEMICAL VAPOR DEPOSITION, 3(5), 1997, pp. 271-279

Authors: BOUKEZZATA M BIELLEDASPET D SARRABAYROUSE G MANSOUR F
Citation: M. Boukezzata et al., CHARACTERISTICS OF THE THERMAL-OXIDATION OF HEAVILY BORON-DOPED POLYCRYSTALLINE SILICON THIN-FILMS, Thin solid films, 279(1-2), 1996, pp. 145-154

Authors: MANSOUR F BOUCHEMAT M BOUKEZZATA M TOUIDJEN NH BIELLEDASPET D MIROUH K
Citation: F. Mansour et al., CONDUCTIVITY OF BORON-IMPLANTED POLYCRYSTALLINE THIN SILICON FILMS, Thin solid films, 261(1-2), 1995, pp. 12-17
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