Authors:
MUNIANDY R
BOYLAN R
CHIN R
BELL N
SANKMAN R
Citation: R. Muniandy et al., DEGRADATION MEASUREMENTS USING FULLY PROCESSED TEST TRANSISTORS IN HIGH-DENSITY PLASMA REACTORS FOR FAILURE ANALYSIS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 1913-1918
Authors:
SETTEMBRINI L
BOYLAN R
STRASSLER H
SCHERER W
Citation: L. Settembrini et al., A COMPARISON OF ANTIMICROBIAL ACTIVITY OF ETCHANTS USED FOR A TOTAL ETCH TECHNIQUE, Operative dentistry, 22(2), 1997, pp. 84-88
Authors:
YIP J
BUCKET P
FERRER J
KOUTSOUKOS J
BOYLAN R
CRAIG R
HAFFAJEE A
TAUBMAN M
Citation: J. Yip et al., SERUM IGG AND PERIODONTAL-DISEASE PROGRESSION IN URBAN MINORITY POPULATIONS, Journal of dental research, 75, 1996, pp. 2690-2690
Citation: Ba. Kaplan et al., EFFECTIVENESS OF A PROFESSIONAL FORMULA DISINFECTANT FOR IRREVERSIBLEHYDROCOLLOID, The Journal of prosthetic dentistry, 71(6), 1994, pp. 603-606