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Authors: GOODHUE WD NITISHIN PM HARRIS CT BOZLER CO RATHMAN DD JOHNSON GD HOLLIS MA

Citation: Wd. Goodhue et al., BRIGHT-FIELD ANALYSIS OF FIELD-EMISSION CONES USING HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND THE EFFECT OF STRUCTURAL-PROPERTIES ON CURRENT STABILITY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 693-696