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Results: 1-9 |
Results: 9
THE EFFECT OF HYDROGEN EVOLUTION ON THE MECHANICAL-PROPERTIES OF HYDROGENATED AMORPHOUS-CARBON
Authors: BENLAHSEN M BRANGER V HENOCQUE J BADAWI F ZELLAMA K
Citation: M. Benlahsen et al., THE EFFECT OF HYDROGEN EVOLUTION ON THE MECHANICAL-PROPERTIES OF HYDROGENATED AMORPHOUS-CARBON, DIAMOND AND RELATED MATERIALS, 7(6), 1998, pp. 769-773
RESIDUAL-STRESSES AND INTRA-GRANULAR MICR OSTRUCTURE DETERMINATION OFTHIN W-FILMS DEPOSITED BY RF MAGNETRON SPUTTERING
Authors: BRANGER V DURAND N HAGHIRIGOSNET AM BADAWI KF RAVET MF
Citation: V. Branger et al., RESIDUAL-STRESSES AND INTRA-GRANULAR MICR OSTRUCTURE DETERMINATION OFTHIN W-FILMS DEPOSITED BY RF MAGNETRON SPUTTERING, Journal de physique. III, 7(6), 1997, pp. 1247-1260
MECHANICAL SPECTROSCOPY AND STRUCTURAL EVOLUTION OF THIN CUMO FILMS
Authors: BRANGER V PELOSIN V
Citation: V. Branger et V. Pelosin, MECHANICAL SPECTROSCOPY AND STRUCTURAL EVOLUTION OF THIN CUMO FILMS, Journal de physique. IV, 6(C8), 1996, pp. 807-810
NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS
Authors: GOUDEAU P BADAWI KF NAUDON A JAULIN M DURAND N BIMBAULT L BRANGER V
Citation: P. Goudeau et al., NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS, Journal de physique. IV, 6(C4), 1996, pp. 187-196
STUDY OF THE MECHANICAL AND MICROSTRUCTURAL STATE OF PLATINUM THIN-FILMS
Authors: BRANGER V PELOSIN V BADAWI KF GOUDEAU P
Citation: V. Branger et al., STUDY OF THE MECHANICAL AND MICROSTRUCTURAL STATE OF PLATINUM THIN-FILMS, Thin solid films, 275(1-2), 1996, pp. 22-24
RESIDUAL-STRESSES INFLUENCE ON THE STRUCTURAL EVOLUTION OF CU-MO SOLID-SOLUTIONS STUDIED BY X-RAY-DIFFRACTION
Authors: GOUDEAU P MIMAULT J GIRARDEAU T REKLAOUI K PROUX O BRANGER V
Citation: P. Goudeau et al., RESIDUAL-STRESSES INFLUENCE ON THE STRUCTURAL EVOLUTION OF CU-MO SOLID-SOLUTIONS STUDIED BY X-RAY-DIFFRACTION, Thin solid films, 275(1-2), 1996, pp. 25-28
PROFILE ANALYSIS OF THIN-FILM X-RAY-DIFFRACTION PEAKS
Authors: BIMBAULT L BADAWI KF GOUDEAU P BRANGER V DURAND N
Citation: L. Bimbault et al., PROFILE ANALYSIS OF THIN-FILM X-RAY-DIFFRACTION PEAKS, Thin solid films, 275(1-2), 1996, pp. 40-43
X-RAY-DIFFRACTION STUDY OF THE SUBSTRUCTURE MODIFICATION INDUCED BY RESIDUAL-STRESSES DURING THE DEPOSITION PROCESS OF 304L STAINLESS-STEELFILMS
Authors: GOUDEAU P BOUBEKER B EYMERY JP BRANGER V
Citation: P. Goudeau et al., X-RAY-DIFFRACTION STUDY OF THE SUBSTRUCTURE MODIFICATION INDUCED BY RESIDUAL-STRESSES DURING THE DEPOSITION PROCESS OF 304L STAINLESS-STEELFILMS, Thin solid films, 275(1-2), 1996, pp. 188-190
INTERNAL-FRICTION AND ITS THERMAL EVOLUTION MEASURED ON VERY THIN PLATINUM FILMS
Authors: PELOSIN V BADAWI KF BRANGER V
Citation: V. Pelosin et al., INTERNAL-FRICTION AND ITS THERMAL EVOLUTION MEASURED ON VERY THIN PLATINUM FILMS, Applied physics letters, 66(6), 1995, pp. 691-693
Risultati: 1-9 |