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Results:
1-8
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Results: 8
Authors:
URITSKY Y
CHEN L
ZHANG S
WILSON S
MAK A
BRUNDLE CR
Citation: Y. Uritsky et al., ROOT CAUSE DETERMINATION OF PARTICLE CONTAMINATION IN THE TUNGSTEN ETCH BACK PROCESS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 1319-1327
Authors:
BRUNDLE CR
GRUNZE M
MADER U
BLANK N
Citation: Cr. Brundle et al., DETECTION AND CHARACTERIZATION OF DIMETHYLETHANOLAMINE-BASED CORROSION-INHIBITORS AT STEEL SURFACES .1. THE USE OF XPS AND TOF-SIMS, Surface and interface analysis, 24(9), 1996, pp. 549-563
Authors:
HOLLDACK K
GRUNZE M
KINZLER M
KERKOW H
BRUNDLE CR
Citation: K. Holldack et al., PHOTOELECTRON AND NEXAFS MICROSCOPY OF RADIATION-INDUCED CHANGES IN CADMIUM ARACHIDATE FILMS, Journal of electron spectroscopy and related phenomena, 73(3), 1995, pp. 239-247
Authors:
BRUNDLE CR
NEFEDOV VI
NEMOSHKALENKO VV
PIREAUX JJ
Citation: Cr. Brundle et al., SPECIAL ISSUE - PROCEEDINGS OF THE 5TH INTERNATIONAL-CONFERENCE ON ELECTRON-SPECTROSCOPY, ICES-5, INSTITUTE-OF-THEORETICAL-PHYSICS, KIEV, UKRAINE, 25 JULY TO 1 AUGUST 1993, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 180000013-180000013
Authors:
BRUNDLE CR
Citation: Cr. Brundle, UPS AT THE BEGINNING, Journal of electron spectroscopy and related phenomena, 66(1-2), 1993, pp. 3-9
Authors:
BAKER AD
BRUNDLE CR
MAIER JP
Citation: Ad. Baker et al., PROFESSOR TURNER,DAVID,W, Journal of electron spectroscopy and related phenomena, 66(1-2), 1993, pp. 180000009-180000010
Authors:
BRUNDLE CR
FOWLER DE
Citation: Cr. Brundle et De. Fowler, CHARACTERIZATION OF YBA2CU3OX USING CORE-LEVEL AND VALENCE-LEVEL XPS, Surface science reports, 19(3-6), 1993, pp. 143-168
Authors:
BAGUS PS
BRUNDLE CR
PACCHIONI G
PARMIGIANI F
Citation: Ps. Bagus et al., MECHANISMS RESPONSIBLE FOR THE SHIFTS OF CORE-LEVEL BINDING-ENERGIES BETWEEN SURFACE AND BULK ATOMS OF METALS, Surface science reports, 19(3-6), 1993, pp. 265-283
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