Authors: BURGERS AR LEGUIJT C LOLGEN P SINKE WC

Citation: Ar. Burgers et al., NEW ANALYTICAL EXPRESSIONS FOR DARK CURRENT CALCULATIONS OF HIGHLY DOPED REGIONS IN SEMICONDUCTOR-DEVICES, I.E.E.E. transactions on electron devices, 44(1), 1997, pp. 171-179

Authors: SCHUURMANS FM SCHONECKER A BURGERS AR SINKE WC

Citation: Fm. Schuurmans et al., SIMPLIFIED EVALUATION METHOD FOR LIGHT-BIASED EFFECTIVE LIFETIME MEASUREMENTS, Applied physics letters, 71(13), 1997, pp. 1795-1797

Authors: HYLTON JD KINDERMAN R BURGERS AR SINKE WC BRESSERS PMMC

Citation: Jd. Hylton et al., UNIFORM PYRAMID FORMATION ON ALKALINE-ETCHED POLISHED MONOCRYSTALLINE(100)SILICON-WAFERS, Progress in photovoltaics, 4(6), 1996, pp. 435-438

Authors: SCHONECKER A EIKELBOOM JA BURGERS AR LOLGEN P LEGUIJT C SINKE WC

Citation: A. Schonecker et al., SENSITIVITY ANALYSIS FOR THE DETERMINATION OF RECOMBINATION PARAMETERS IN SI WAFERS USING HARMONIC CARRIER GENERATION, Journal of applied physics, 79(3), 1996, pp. 1497-1504

Authors: EIKELBOOM JA LEGUIJT C FRUMAU CFA BURGERS AR

Citation: Ja. Eikelboom et al., MICROWAVE DETECTION OF MINORITY-CARRIERS IN SOLAR-CELL SILICON-WAFERS, Solar energy materials and solar cells, 36(2), 1995, pp. 169-185

Authors: LEGUIJT C LOLGEN P BURGERS AR EIKELBOOM JA STEEMAN RA SINKE WC ALKEMADE PFA SARRO PM

Citation: C. Leguijt et al., CORRELATION OF EFFECTIVE RECOMBINATION VELOCITY OF A BACKSURFACE FIELD WITH A BORON CONCENTRATION PROFILE, Journal of applied physics, 78(11), 1995, pp. 6596-6603