Authors: SAUNDERS M BIRD DM ZALUZEC NJ BURGESS WG PRESTON AR HUMPHREYS CJ

Citation: M. Saunders et al., MEASUREMENT OF LOW-ORDER STRUCTURE FACTORS FOR SILICON FROM ZONE-AXISCBED PATTERNS, Ultramicroscopy, 60(2), 1995, pp. 311-323

Authors: BURGESS WG PRESTON AR BOTTON GA ZALUZEC NJ HUMPHREYS CJ

Citation: Wg. Burgess et al., BENEFITS OF ENERGY-FILTERING FOR ADVANCED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS, Ultramicroscopy, 55(3), 1994, pp. 276-283