BENEFITS OF ENERGY-FILTERING FOR ADVANCED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS

Citation
Wg. Burgess et al., BENEFITS OF ENERGY-FILTERING FOR ADVANCED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS, Ultramicroscopy, 55(3), 1994, pp. 276-283
Citations number
13
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
55
Issue
3
Year of publication
1994
Pages
276 - 283
Database
ISI
SICI code
0304-3991(1994)55:3<276:BOEFAC>2.0.ZU;2-5
Abstract
Energy filtering is well known to have a dramatic effect on the appear ance of standard, zone-axis convergent beam electron diffraction patte rns. In this paper, the effects of energy filtering on some less-commo n types of CBED patterns are shown. In particular, the (002) and (402) quasi-forbidden reflections in silicon are investigated, and the effe cts of energy filtering demonstrated. The filtering of HOLZ excess lin es in large-angle zone-axis patterns is shown, as these patterns are o f interest for Debye-Waller factor determination. Filtered and unfilte red bright-field large-angle CBED (LACBED) patterns of aluminium are p resented along with EELS spectra to demonstrate the partial removal of inelastically scattered electrons due to the LACBED geometry.