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Results:
1-14
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Results: 14
Authors:
BEHREND OP
OULEVEY F
GOURDON D
DUPAS E
KULIK AJ
GREMAUD G
BURNHAM NA
Citation: Op. Behrend et al., INTERMITTENT CONTACT - TAPPING OR HAMMERING, Applied physics A: Materials science & processing, 66, 1998, pp. 219-221
Authors:
LILEY M
GOURDON D
STAMOU D
MESETH U
FISCHER TM
LAUTZ C
STAHLBERG H
VOGEL H
BURNHAM NA
DUSCHL C
Citation: M. Liley et al., FRICTION ANISOTROPY AND ASYMMETRY OF A COMPLIANT MONOLAYER INDUCED BYA SMALL MOLECULAR TILT, Science, 280(5361), 1998, pp. 273-275
Authors:
OULEVEY F
GREMAUD G
SEMOROZ A
KULIK AJ
BURNHAM NA
DUPAS E
GOURDON D
Citation: F. Oulevey et al., LOCAL MECHANICAL SPECTROSCOPY WITH NANOMETER-SCALE LATERAL RESOLUTION, Review of scientific instruments, 69(5), 1998, pp. 2085-2094
Authors:
BURNHAM NA
BEHREND OP
OULEVEY F
GREMAUD G
GALLO PJ
GOURDON D
DUPAS E
KULIK AJ
POLLOCK HM
BRIGGS GAD
Citation: Na. Burnham et al., HOW DOES A TIP TAP, Nanotechnology, 8(2), 1997, pp. 67-75
Authors:
GALLO PJ
KULIK AJ
BURNHAM NA
OULEVEY F
GREMAUD G
Citation: Pj. Gallo et al., ELECTRICAL-CONDUCTIVITY SFM STUDY OF AN ULTRAFILTRATION MEMBRANE, Nanotechnology, 8(1), 1997, pp. 10-13
Authors:
TAKAHASHI K
BURNHAM NA
POLLOCK HM
ONZAWA T
Citation: K. Takahashi et al., STIFFNESS OF MEASUREMENT SYSTEM AND SIGNIFICANT FIGURES OF DISPLACEMENT WHICH ARE REQUIRED TO INTERPRET ADHESIONAL FORCE CURVES, IEICE transactions on electronics, E80C(2), 1997, pp. 255-262
Authors:
STAMOU D
GOURDON D
LILEY M
BURNHAM NA
KULIK A
VOGEL H
DUSCHL C
Citation: D. Stamou et al., UNIFORMLY FLAT GOLD SURFACES - IMAGING THE DOMAIN-STRUCTURE OF ORGANIC MONOLAYERS USING SCANNING FORCE MICROSCOPY, Langmuir, 13(9), 1997, pp. 2425-2428
Authors:
OULEVEY F
BURNHAM NA
KULIK AJ
GALLO PJ
GREMAUD G
BENOIT W
Citation: F. Oulevey et al., MECHANICAL-PROPERTIES STUDIED AT THE NANOSCALE USING SCANNING LOCAL-ACCELERATION MICROSCOPY (SLAM), Journal de physique. IV, 6(C8), 1996, pp. 731-734
Authors:
BURNHAM NA
KULIK AJ
GREMAUD G
GALLO PJ
OULEVEY F
Citation: Na. Burnham et al., SCANNING LOCAL-ACCELERATION MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 794-799
Authors:
BURNHAM NA
GREMAUD G
KULIK AJ
GALLO PJ
OULEVEY F
Citation: Na. Burnham et al., MATERIALS PROPERTIES MEASUREMENTS - CHOOSING THE OPTIMAL SCANNING PROBE MICROSCOPE CONFIGURATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1308-1312
Authors:
BURNHAM NA
KULIK AJ
GREMAUD G
BRIGGS GAD
Citation: Na. Burnham et al., NANOSUBHARMONICS - THE DYNAMICS OF SMALL NONLINEAR CONTACTS, Physical review letters, 74(25), 1995, pp. 5092-5095
Authors:
POLLOCK HM
BURNHAM NA
COLTON RJ
Citation: Hm. Pollock et al., ATTRACTIVE FORCES BETWEEN MICRON-SIZED PARTICLES - A PATCH CHARGE MODEL, The Journal of adhesion, 51(1-4), 1995, pp. 71-86
Authors:
BURNHAM NA
Citation: Na. Burnham, ACCOUNTING FOR THE STIFFNESSES OF THE PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2219-2221
Authors:
BURNHAM NA
Citation: Na. Burnham, APPARENT AND TRUE FEATURE HEIGHTS IN FORCE MICROSCOPY, Applied physics letters, 63(1), 1993, pp. 114-116
Risultati:
1-14
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