Authors: Bals, S Rijnders, G Blank, DHA Van Tendeloo, G

Citation: S. Bals et al., TEM of ultra-thin DyBa2Cu3O7-x films deposited on TiO2 terminated SrTiO3, PHYSICA C, 355(3-4), 2001, pp. 225-230

Authors: Andersen, LG Bals, S Van Tendeloo, G Poulsen, HF Liu, YL

Citation: Lg. Andersen et al., Transmission electron microscopy investigation of Bi-2223/Ag tapes, PHYSICA C, 353(3-4), 2001, pp. 251-257

Authors: Salluzzo, M Aruta, C Maggio-Aprile, I Fischer, O Bals, S Zegenhagen, J

Citation: M. Salluzzo et al., Growth of R1+xBa2-xCu3O7-delta epitaxial films investigated by in situ scanning tunneling microscopy, PHYS ST S-A, 186(3), 2001, pp. 339-364

Authors: Bals, S Van Tendeloo, G Salluzzo, M Maggio-Aprile, I

Citation: S. Bals et al., Why are sputter deposited Nd1+xBa2-xCu3O7-delta thin films flatter than NdBa2Cu3O7-delta films?, APPL PHYS L, 79(22), 2001, pp. 3660-3662