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Citation: S. Cardoso et al., Electrode roughness and interfacial mixing effects on the tunnel junction thermal stability, J APPL PHYS, 89(11), 2001, pp. 6650-6652

Authors: Zhang, ZZ Cardoso, S Freitas, PP Batlle, X Wei, P Barradas, N Soares, JC

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Authors: Zhang, ZZ Cardoso, S Freitas, PP Wei, P Barradas, N Soares, JC

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