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Citation: M. Regis et al., Noise behavior in SiGe devices, SOL ST ELEC, 45(11), 2001, pp. 1891-1897

Authors: Bary, L Borgarino, M Plana, R Parra, T Kovacic, SJ Lafontaine, H Graffeuil, J

Citation: L. Bary et al., Transimpedance amplifier-based full low-frequency noise characterization setup for Si/SiGe HBTs, IEEE DEVICE, 48(4), 2001, pp. 767-773