Authors: Batista, JA Takeuti, D Mansanares, AM da Silva, EC

Citation: Ja. Batista et al., Contrast and sensitivity enhancement in Photothermal Reflectance Microscopy through the use of specific probing wavelengths: applications to microelectronics, ANAL SCI, 17, 2001, pp. S73-S75

Authors: Batista, JA Mansanares, AM da Silva, EC Vaz, CC Miranda, LCM

Citation: Ja. Batista et al., Optothermal interference technique applied to the investigation of transparent layered structures, ANAL SCI, 17, 2001, pp. S76-S79

Authors: Batista, JA Mansanares, AM da Silva, EC Vaz, CC Miranda, LCM

Citation: Ja. Batista et al., Contrast enhancement in the detection of defects in transparent layered structures: The use of optothermal interference technique in solar cell investigation, J APPL PHYS, 88(9), 2000, pp. 5079-5086